Yokogawa AQ2200-642 Transceiver I/F Module

Category - Modular Manufacturing Test System

FAMAGA always strives to provide the best prices and timings of supplies for its customers. We sell only original equipment and spare parts, although we are not always the official distributor or manufacturer's dealer. All displayed trademarks and part numbers are the property of their respective owners.

Our array of items consists of huge number of goods of the Yokogawa. Yokogawa produces dynamic and innovative products that always find the solution for the tough industrial problems at any time. The Yokogawa achieves the high standards of equipment performance while creating the modern technologies that improve the work cycle of the industries. The Yokogawa Yokogawa AQ2200-642 Transceiver I/F Module is one of the masterly designed items. Yokogawa Yokogawa AQ2200-642 Transceiver I/F Module presents high degree of precision, which offer wide range of automatic and electric resolutions to fulfill all application needs. Because of the high quality of constituents, Yokogawa Yokogawa AQ2200-642 Transceiver I/F Module ensure long time of use.
As the greatest industrial provider of various brands, we always committed to establish splendid experience to our purchasers by offering huge number of industrial outfit and constituent parts at affordable prices with the brilliant chain of supply in the brief period of time. A top level of determination permit us to distribute any shape of product in the quickest period of time and respond the needs of our consumers in the processing sector. As for the charges and transit period, please fill in the form or submit your order to sales@famaga.us">sales@famaga.us

Description

The AQ2200-642 reduces the complexity and cost of 10G optical transceiver testing by combining bus and power control features into the same mainframe that performs Signal Generation, BERT and Optical testing. This allows a single programming interface to control all aspects of the transceiver test, simplifying test setup, decreasing test time and increasing productivity. The wiring complexity and test bench size are reduced by replacing separate Digital Multi-Meters, Programmable Power supplies and Serial I/F controllers with a single module.
Power supply, signal control, monitoring for 10G transceiver in one module